The fab-to-OSAT glossary.
68 terms used on semiconductor manufacturing floors and in the meetings about them, each defined in one or two plain sentences.
- Abatement
- Equipment that treats the exhaust of process tools, destroying or capturing hazardous gases before they reach the facility exhaust. It normally sits in the sub-fab.
- Advanced packaging
- Packaging methods that connect dies at a much finer pitch than wire bonding, or put several dies in one package: flip-chip, fan-out wafer-level packaging, 2.5D interposers and 3D stacking.
- AEC-Q100Automotive Electronics Council qualification
- The stress-test qualification standard for packaged integrated circuits used in vehicles. Automotive customers commonly require it of their assembly and test suppliers.
- AMHSAutomated Material Handling System
- The overhead and floor-level transport that moves wafer carriers between tools and stockers inside a fab.
- ATEAutomatic Test Equipment
- The tester that applies electrical signals to a chip and decides pass or fail, used at wafer sort and at final test.
- ATMPAssembly, Testing, Marking and Packaging
- The back-end stage that turns finished wafers into packaged, tested and marked chips. The work is the same as in an OSAT; the term is usually applied to a facility a company runs for its own products.
- Back-end manufacturing
- Everything after the wafer leaves the fab: dicing, die attach, interconnect, encapsulation, test and marking. Not the same thing as BEOL.
- BEOLBack End of Line
- The part of wafer processing that builds the metal interconnect layers above the transistors.
- Blue-collar roles
- Shop-floor production roles that work to defined procedures: production and assembly operators, material handlers, tool move-in crews and line support staff.
- Build-operate-transferBOT
- A workforce model in which a provider recruits and runs a team for a client for a set period, then transfers the team to the client’s payroll.
- Bulk gases
- Gases a fab uses in large volume, such as nitrogen, oxygen, argon and hydrogen, usually supplied by pipeline or on-site generation.
- Bumping
- Forming small solder or copper bumps on the pads of a wafer so that dies can be mounted face-down as flip-chips.
- Burn-in
- A screen in which chips are run at raised temperature and voltage to bring out early-life failures before shipment.
- Cleanroom
- A controlled space in which airborne particles, temperature, humidity and pressure are held within tight limits. Cleanliness is classified by ISO 14644-1 class.
- CMPChemical Mechanical Planarisation
- A polishing step that flattens the wafer surface between layers, using a slurry and a pad.
- Compound semiconductor
- A semiconductor made from two or more elements, such as silicon carbide (SiC) or gallium nitride (GaN). Widely used in power and radio-frequency devices.
- Cycle time
- The elapsed time for a lot to travel from wafer start to completion. The main measure of how fast a fab moves product.
- Dicing
- Cutting a finished wafer into individual dies. Also called singulation.
- Die
- A single chip on a wafer, before it is packaged. Plural: dies or dice.
- Die attach
- The assembly step that fixes a die to its leadframe or substrate.
- DLI schemeDesign Linked Incentive
- A Government of India scheme that supports domestic chip-design companies with financial incentives and design-infrastructure support.
- EDAElectronic Design Automation
- The software used to design, simulate and verify integrated circuits.
- Excursion
- An unplanned shift in a process or in defect levels that puts product at risk. It needs containment first and a root-cause fix second.
- FabFabrication plant
- A facility where wafers are processed into chips. Also called a wafer fab or front-end fab.
- Fabless
- A company that designs chips and has them manufactured by a foundry and an OSAT.
- FDCFault Detection and Classification
- Software that watches tool sensor data during each run and flags or stops runs that behave abnormally.
- Final test
- The electrical test of a packaged device before it ships.
- Flip-chip
- A package in which the die is mounted face-down and connected through bumps instead of bond wires.
- Foundry
- A fab that manufactures chips designed by other companies.
- FOUPFront Opening Unified Pod
- The sealed carrier that holds 300 mm wafers and docks with process tools.
- Front-end manufacturing
- Wafer fabrication: all processing done on the wafer inside the fab.
- Grey-collar roles
- Skilled, hands-on technical roles between engineer and operator: process, equipment, facilities and maintenance technicians, quality inspectors and test technicians.
- Hook-up
- Connecting an installed tool to its utilities (power, process gases, chemicals, ultrapure water, exhaust and vacuum) so that it can be started up.
- IATF 16949
- The quality-management-system standard of the automotive industry. Often required of assembly and test suppliers that serve automotive customers.
- IDMIntegrated Device Manufacturer
- A company that both designs and manufactures its own chips.
- ISMIndia Semiconductor Mission
- The Government of India body, under the Ministry of Electronics and Information Technology, that administers the country’s semiconductor and display manufacturing programmes.
- Known good dieKGD
- A bare die that has been tested to the quality level of a packaged part, so that it can be used safely in a multi-die package.
- Leadframe
- The metal frame that carries the die and forms the leads of many package types.
- Lithography
- The process step that transfers a circuit pattern onto the wafer using light and a photosensitive resist.
- Lot
- A group of wafers, or of packaged units, processed together and tracked as one unit.
- MESManufacturing Execution System
- The software that tracks every lot, enforces the process route and records what was done at each step.
- Metrology
- Measurement of what was made: film thickness, critical dimension, overlay and other parameters.
- Mold compound
- The epoxy material that encapsulates the die and wires in a plastic package.
- NPINew Product Introduction
- The work of bringing a new device or package from engineering samples to qualified production.
- OEEOverall Equipment Effectiveness
- A measure of how well a tool is used: availability multiplied by performance multiplied by quality.
- OSATOutsourced Semiconductor Assembly and Test
- A company that assembles, packages and tests chips as a service for other companies.
- PDKProcess Design Kit
- The set of files a foundry gives designers that describes its process: device models, design rules and layout cells.
- Physical design
- Turning a verified circuit description into manufacturable layout: floorplanning, placement, clock-tree synthesis, routing and sign-off.
- Qualification
- Showing with data that a tool, process, material, supplier or product meets its specification before it is used for production.
- Ramp
- The period in which a line’s output rises from first lots to planned volume.
- Recipe
- The set of parameters a tool runs for a given process step.
- Second source
- A qualified alternative supplier for a material, part or service, kept so that one supplier’s problem does not stop the line.
- SEMI S2
- The industry guideline for environmental, health and safety aspects of semiconductor manufacturing equipment.
- Skills matrix
- A table of who is certified to do which task on which tool, at what level. The basis for shift cover and training plans.
- SPCStatistical Process Control
- Using control charts on process and measurement data to detect drift before it produces defects.
- Specialty gases
- Process gases used in smaller volumes and at high purity, many of them toxic, corrosive or flammable, for steps such as etch, deposition and doping.
- Sub-fab
- The level beneath the cleanroom that houses pumps, abatement, chillers and the gas and chemical distribution that serve the tools above.
- Substrate
- In packaging, the laminate or ceramic base on which a die is mounted and which carries its connections to the board. In wafer processing, the wafer itself.
- Tape-out
- The release of a finished chip design to the foundry for manufacturing.
- Technology transfer
- Moving a qualified process or product from one site or company to another, with the documents, training and matching data needed to reproduce it.
- Tool move-in
- Delivering a piece of equipment into the cleanroom and positioning it on its pedestal, before hook-up.
- UPWUltrapure Water
- Water purified to extremely low levels of ions, particles and organics, used to rinse wafers.
- Wafer
- A thin, polished slice of semiconductor, most often silicon, on which chips are built.
- Wafer sort
- The electrical test of every die on a wafer before dicing. Also called wafer probe.
- White-collar roles
- Engineering, design and management roles: process, equipment and design engineers, technical architects and project managers.
- WIPWork in progress
- Lots that have started but not finished. How WIP is spread across the line largely decides cycle time.
- Wire bonding
- Connecting the pads of a die to its package with fine gold, copper or aluminium wire.
- Yield
- The fraction of good units. Line yield counts wafers that survive processing, sort yield counts good dies per wafer, and final-test yield counts good packaged parts.
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Scope
Definitions are general and written for orientation. Individual companies and standards bodies may use narrower meanings. If a term you need is missing, tell us.
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